ATP 3D TLC S750/S650 Series High-Endurance/Low-Latency SD/microSD Cards

ATP Electronics, Inc. introduces its 3D TLC S750/S650 Series SD and microSD memory cards built for non-stop video recording.

They meet the endurance, low latency, and built-to-last storage requirements of dashcams and DVRs, as well as surveillance systems, autonomous vehicles, and other write-intensive applications.

Endurance over 109,000 Hours ⁽¹⁾ of recording time in native TLC
Video evidence can prove critical in many scenarios; hence, it is important for SD/microSD cards to record non-stop without compromising image quality and integrity. The S650 Series can record Full HD videos continuously up to 109,401 hours – far longer than similar cards marketed as ‘high endurance.’ The S650 Series is based on 5K program/erase (P/E) cycles, which translate to 1.6x higher endurance than typical memory cards with 3K P/E cycles. The S750 Series, configured as pseudo single-level cell (pSLC) is based on 60,000 P/E cycles, while typical pSLC memory cards are rated for around 20,000 to 30,000 P/E cycles.

Following graph ⁽²⁾ shows endurance simulation result of S650 128GB microSD compared with other high-endurance branded cards of same capacity, in full HD mode:

⁽¹⁾ Tested using 128GB ATP S650 TLC card based on 13Mb/s (lowest bitrate of HD recording) in best-case/ideal scenario, with no other influencing factors.
⁽²⁾ Information sourced by ATP from publicly available data.
To record new data, the oldest data will be overwritten when the card is full.
1Mb/s=1,000,000b/s

Low latency: Ready to record in <1 second, writes 50% faster
After power on, drive recorders may have to wait a few seconds to be ready for recording. The time between the first read command and the first write command from host is the ‘response time.’ The firm’s S650 and S750 Series cards take less than 1s response time while normal cards may take 7 to 12s based on real tests on a DVR at room temperature.

While recording 16MB/s data sequentially, S650 cards take less than 0.1s, saving 50% of writing time compared with consumer-rated cards and enabling fast backup without data loss.

Own HW/FW design features offer reliability
As a manufacturer with its own hardware/firmware capability, the company can adjust to a variety of usages to fulfill customers’ specific application requirements and conditions. Based on customers’ applications, the firm does its best to meet the requirements by FW and HW design.

• Auto-Read Calibration (ARC). Over time and with constant use, NAND flash memory cells degrade, causing voltage shifts that increase BER. When the normal Read Retry function is not enough to recover the errors, a more precise ‘Auto Read Calibration’ (ARC) is applied to assure data integrity at extreme temperature or degraded NAND cells.

• Methodology for advanced card analysis. The firm’s memory cards are IP67/IP57-certified and manufactured using System-in-Package (SiP) wafer/die process, making it difficult to do component analysis compared to SMT (surface- mount technology) process. The company’s designed substrate and debug tool make this mission ‘possible.’

1. 1. Firm-developed hardware design – Substrate with reserved testing pin is available for future component analysis.

   2. Solder hask removal by laser – Precise and efficient method to remove solder mask so as to reach the reserved testing pins on the substrate.

   3. Company’s own customized debug tool – This is connected to the HW reserved testing pin and then linked to the SW analysis system.

Specs: