R&D: DNA Storage Monitoring with Complementary Metal-Oxide-Semiconductor Capacitive Sensor

IEEEXplore has published, in 2022 20th IEEE Interregional NEWCAS Conference (NEWCAS) proceedings, an article written by Hamed Osouli Tabrizi, Saghi Forouhi, Morteza Ghafar-Zadeh, Omid Farhanieh, Tina Shaffaf, Sebastian Magierowski, and Ebrahim Ghafar-Zadeh, Department of Electrical Engineering and Computer Science (EECS), BioSA Lab, Lassonde school of engineering, York University, ON, Canada.

Abstract: “This paper reports a complementary metal-oxide-semiconductor (CMOS) capacitive sensor for monitoring dried DNA mass. The experimental results have successfully shown the capability of this sensor to detect down to 45 ng/μL mass of dried DNA in the detection range of sub-pico Mol. Our experiments suggest that the proposed sensor can be used to monitor the physical storage of dried DNA material in emerging DNA memory technologies.“

Notes: This article was mistakenly omitted from the original submission to IEEE Xplore. It is now included as part of the conference record.