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ATP Electronics’ 11K P/E Cycles PCIe Gen 4×4 Industrial SSDs Offer Highest Native TLC Endurance

Up to 8TB, N651Si/N651Sc Series boasts 11,000 program/erase (P/E) cycles endurance

ATP Electronics, Inc. has once again achieved a breakthrough in extending the endurance of its industrial 3D TLC SSDs.

Atp Electronics’ 11k Pe Cycles Pcie Gen 4x4 Industrial Ssd

The N651Si/N651Sc Series boasts an unparalleled 11,000 program/erase (P/E) cycles endurance — an 120% leap from its initial published endurance of 5,000 cycles, making these solutions the highest-endurance industrial native TLC SSDs built on 512Gb IC package.

This achievement is made possible through the company’s outstanding capabilities that extend the inherent qualities of the NAND flash. The use of prime NAND package, strict NAND IC characterization, 100% NAND screening and validation capabilities, as well as ATP’s proprietary firmware, specialized hardware configurations, and own-developed technologies made this extraordinary feat possible.

The company’s testing approach ensures thorough assessment of the NAND flash’s overall endurance under different test methods to enable the trailblazing achievement of 11K P/E cycles endurance. The methodology evaluates performance across various aspects, including initial RW operations, endurance (P/E cycles), data retention, cross-temperature behavior, and read disturb characteristics. Rigorous testing, which includes error correct reliability, erase/program/read (EPR), and other endurance tests, demonstrates that the N651Si/N651Sc Series SSDs offer performance and endurance characteristics that meet suitability requirements for high-endurance applications under various conditions.

With this endurance boost, the N651Si/N651Sc Series SSDs surpass the average TLC performance and lifespan, making these SSDs for write-intensive workloads.

Translating to a drive-level endurance of 1 drive write per day (DWPD) with default 7% overprovisioning (OP), along with its wide 125°C operating range for I-Temp N651Si (-40°C to 85°C), the 11K solutions offer the best cost-per-endurance and TCO commercial value compared with competing 3K solutions.

Atp N651si N651sc Series Scheme1

The 11K solution covers the company’s PCIe Gen 4×4 M.2/U.2/E1.S SSDs, CFexpress, and SD/microSD cards that have already been mass produced, with implementation plans on the latest refresh of SATA SSDs.

Performance Leadership
The firm’s N651Sc 8TB M.2 SSD model delivers measurable improvements over comparable 8TB industrial SSDs, offering up to 119% higher sequential write speeds, while sustained write speeds are 32% higher.

Atp N651si N651sc Series Scheme2Exclusive SSD Technologies:

AcuCurrent Technology: Innovative Signal Integrity Optimization
AcuCurrent dynamically fine-tunes the SSDs in real time to ensure optimal signal integrity across all current routes.

It fortifies SSD product lifetime and reliability through dynamic, temperature-responsive adjustments that minimize errors and unnecessary read retries, thus potentially reducing bad block counts and preserving spare blocks. It also ensures stable performance across a wide range of operating ranges up to 125°C, enhancing the SSD’s resilience to environmental and temperature variations.

The following table shows how AcuCurrent’s dynamic settings eliminate unnecessary read retries compared with typical fixed settings.

Driving Setting*

SSD #1
Read Retry Count
@70C

SSD #2
Read Retry Count
@70C

SSD #3
Read Retry Count
@70C

SSD #4
Read Retry Count
@70C

Fixed setting

240

6

622

687

Dynamic setting

0

0

0

0

AcuCurrent is initially available on E1.S SSDs, with firmware adoption plans on M.2 and U.2 SSDs.

ATP PLP Diag Technology: Proactive PLP Capacitor Health Check
PLP Diag averts power loss protection (PLP) mechanism failure by proactively checking the functionality and health status of the polymer tantalum capacitors.

If capacitors fail, the SSD switches to Direct TLC mode, bypassing DRAM caching for writes. Users can also verify the PLP status through SMART commands, ensuring continuous data protection and system reliability.

Atp N651si N651sc Series Scheme3

Product Specs:

 

PCIe® Gen4 NVMe M.2 SSD

PCIe® Gen4 NVMe U.2 SSD

PCIe® Gen4 NVMe E1.S SSD

Product Line

Superior

Superior

Superior

N651Si / N651Sc

N651Si

N651Si

Interface

PCIe G4 x4

PCIe G4 x4

PCIe Gen4x4

Flash Type

3D TLC

3D TLC

3D TLC

Form Factor

M.2 2280-D6-M / M.2 2280-D5-M / M.2 2280-D2-M

U.2

E1.S

Operating Temperature

-40°C to 85°C / 0°C to 70°C

-40°C to 85°C

-40°C to 85°C

Power Loss Protection Options

Hardware + Firmware Based
/ Firmware Based (1)

Hardware + Firmware Based

Hardware + Firmware Based

Optional SED Features

AES 256-bit Encryption, TCG Opal 2.0

AES 256-bit Encryption, TCG Opal 2.0

AES 256-bit Encryption, TCG Opal 2.0

Capacity

240GB to 7.68TB

960GB to 7.68TB

960GB to 7.68TB

Performance

 

 

 

Sequential Read (MB/s) up to

6,450

6,000

6,400

Sequential Write (MB/s) up to

6,050

6,000

6,100

Random Reads IOs up to

1,091,000

870,000

1,000,000

Random Writes IOs up to

1,245,000

1,230,000

1,200,000

Endurance and Reliability

 

 

 

Endurance (TBW) (2) up to

76,400 TB

76,000 TB

79,000 TB

Reliability
MTBF @ 25°C

>3,000,000 hours

>3,000,000 hours

>3,000,000 hours

Others

 

 

 

Dimensions (mm)

80 × 22 × 3.85 mm
80 × 22 × 3.9 mm
80 × 22 × 3.6 mm
Optional 8 mm heatsink

100 x 69.85 x 15

118.75 x 33.75 x 9.5

Certifications

CE, FCC, BSMI, UKCA, RoHS, REACH, UL

RoHS/VCCI/CE/FCC/UKCA

RoHS/VCCI/CE/FCC/UKCA

Warranty

3 years

3 years

5 years

(1) M.2 2280-D6-M (max height: 3.85mm) offers hardware-based power loss protection, while M.2 2280-D5-M
(max height: 3.9mm) and M.2 2280-D2-M (max height: 3.6mm) provide firmware-based power loss protection.
(2) Under highest Sequential write value. May vary by density, configuration and applications.

Resources:
PCIe Gen4 NVMe M.2 SSD   
PCIe Gen4 NVMe U.2 SSD    
PCIe Gen4 NVMe E1.S SSD

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