iStart-Tek Assigned Patent

iStart-Tek Inc., Zhubei, Taiwan, has been assigned a patent (12308081) developed by Han; Cheng-Yen, Zhubei, Taiwan, for “configurable testing and repair system for non-volatile memory.“

The abstract of the patent published by the U.S. Patent and Trademark Office states: “A configurable testing and repair system for a non-volatile memory includes: a memory testing device capable of carrying a to-be-tested memory performs a test operation on the to-be-tested memory to determine whether or not the to-be-tested memory is a to-be-repaired memory that needs to be repaired, and performs a diagnostic operation on the to-be-repaired memory, so as to generate defect data including a fault address and a fault data value; a memory repair device capable of carrying the to-be-repaired memory performs a repair operation on the to-be-tested memory according to the defect data; and a control device connected to the memory testing device and the memory repair device controls the memory testing device to perform the test operation and the diagnostic operation, and to control the memory repair device to perform the repair operation.”

The patent application was filed on 2024-01-31 (18/428471).