R&D: Complementary Use of Sensitive Nanoscale and Bulk Techniques to Probe Surface and Subsurface Defects in High Volume Manufacturing

Microscopy and Microanalysis has published an article written by Carol A Johnson, Indra Subedi, Stephen Exarhos, Joseph Roth, Michael Kautzky, and Karen Terry, Seagate Technology, Bloomington, MN, USA.

Abstract: “The development and production of heat-assisted magnetic recording (HAMR) [1] hard disc drive (HDD) storage devices involve frequent challenges for surface and subsurface materials characterization, and therefore many opportunities for creativity and innovation. With HAMR technology, the portion of the plasmonic near-field transducer (NFT) that directs heat towards the media during the data write process can experience momentary heat fluxes of greater than 100 TW/m² and temperatures in excess of 300°C. Temperatures during various recording head build process steps may also reach a few hundred degrees. During these periods of extreme temperature and stress, the structural, chemical, thermal, and optical properties of the recording head materials may change [2]. Over time, what could be a small or insignificant defect during production could become more problematic. Therefore, it is critical that we use, in concert, a variety of surface and subsurface analytical tools to characterize the subtleties of the metals, dielectrics, and interfaces in recording heads.“