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R&D: Factors That Control Stability, Variability, and Reliability Issues of Endurance Cycle in ReRAM Devices, Phase Field Study

Believing that computational approach of connecting morphological changes of CF with electrical response has potential to further understand and optimize performance of ReRAM devices

Journal of Applied Physics has published an article written by Arijit Roy, Min-Gyu Cho, and Pil-Ryung Cha, School of Materials Science and Engineering, Kookmin University, Seoul 02707, Republic of Korea.
Abstract: “The morphological evolution of the...

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