National Instruments Assigned Patent

National Instruments Corporation, Austin, TX, has been assigned a patent (11,321,341) developed by Chandhoke, Sundeep, Watson, Michael S., del Castillo, Alejandro, and Wilson, Daren K., Austin, TX, for a “dynamic metadata extraction workflow for measurement data storage.“

The abstract of the patent published by the U.S. Patent and Trademark Office states: “A method to dynamically analyze measurement data comprising measurement data sets as the measurement data is received and moved to a data warehouse. The program instructions may receive the measurement data and may extract first metadata from the measurement data. The program instructions may then extract and analyze measurement data points in the measurement data to determine if the measurement data points meet a first criteria and generate second metadata in response to determining that the measurement data points meet the first criteria. The program instructions may then provide the measurement data points, the first metadata and the second metadata to a data warehouse for storage. The analysis of the measurement data and creation of new metadata may be performed dynamically as the data is acquired and stored in the data warehouse.”

The patent application was filed on May 15, 2020 (16/875,669).