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Shenzhen Shichuangyi Electronics and Silicon Motion Assigned Patent

Batch automatic test method and test device for SSDs

Shenzhen Shichuangyi Electronics Co., Ltd., Shenzhen, China, and Silicon Motion, Inc., Zhubei, Taiwan, has been assigned a patent (10,768,852) developed by Ni, Huang-Zhong, and Cheng, Jun, Shenzhen, China, for “batch automatic test method for solid state disks and batch automatic test device for solid state disks.

The abstract of the patent published by the U.S. Patent and Trademark Office states: A batch automatic test method and a batch automatic test device for solid state disks are provided. The batch automatic test method is used for testing a plurality of solid state disks by a batch automatic test device. The solid state disks are coupled to the batch automatic test device. The batch automatic test method includes the following steps. A plurality of buses of the batch automatic test device are scanned to mark the solid state disks and a system disk. A piece of disk information of each of the solid state disks is shown. Each of the pieces of the disk information includes a disk location of each of the solid state disks. A formatting procedure is synchronously performed on the solid state disks according to the disk locations. After performing the formatting procedure, a burn-in test procedure is automatically and synchronously performed on the solid state disks.

The patent application was filed on February 28, 2019 (16/288,611).

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