IEEE Xplore has published, in 2019 International Conference on Electronics, Information, and Communication (ICEIC) Proceedings, an article written by Jung-Hoon Cho, and Soo-Il Choi, Exicon Co., Ltd., R&D Center, Exicon Korea-Tech Research Institute, Seongnam-si, Korea.
Abstract: “Portable SSD test system inspects SSDs during final semiconductor manufacturing processes. SSD is a next-generation mass storage device. As high protocol speed required, SSD interface is being moved to PCI-Express generation4. In this study, PCI-Express Gen4.0 based Portable Test System was designed. Multiple protocols, such as SATA, SAS, and NVMe test feature is included. The equipment adopt air-cooling system rather than water cooling system for compact design to remove heat that produced during SSD test process. Portable compact design can improve SSD process time.“