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R&D: PCIe Gen4.0 Based Portable SSD Test System

Adopting air rather than water cooling system for compact design to remove heat that produced during test process

IEEE Xplore has published, in 2019 International Conference on Electronics, Information, and Communication (ICEIC) Proceedings, an article written by Jung-Hoon Cho, and Soo-Il Choi, Exicon Co., Ltd., R&D Center, Exicon Korea-Tech Research Institute, Seongnam-si, Korea.

Abstract: Portable SSD test system inspects SSDs during final semiconductor manufacturing processes. SSD is a next-generation mass storage device. As high protocol speed required, SSD interface is being moved to PCI-Express generation4. In this study, PCI-Express Gen4.0 based Portable Test System was designed. Multiple protocols, such as SATA, SAS, and NVMe test feature is included. The equipment adopt air-cooling system rather than water cooling system for compact design to remove heat that produced during SSD test process. Portable compact design can improve SSD process time.

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