IEEE Xplore has published, in 2018 15th International Conference on Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology (ECTI-CON), an article written by Panadda Jariampan, College of Advanced Manufacturing Innovation (AMI), King Mongkut’s Institute of Technology Ladkrabang, Ladkrabang Bangkok (KMITL), and Seagate Technology (Thailand), Thailand, and Chanon Warisarn, College of Advanced Manufacturing Innovation (AMI), King Mongkut’s Institute of Technology Ladkrabang, Ladkrabang Bangkok (KMITL), Thailand.
Abstract: “Bit-error rate (BER) is used as a primary metric in write power-on hours (wPOH) measurement of heat-assisted magnetic recording (HAMR) drive. BER is measured after writing process represented writing quality while read-only BER showed reading quality or read reference in the measurement. The read-reference BER usually remains close to its initial value, however, in some cases it shows BER fluctuation or degradation as well. Therefore, in this paper focuses on the read-reference BER categorization and an improvement of the categorization algorithm.“