Unitest Assigned Patent
Detection system for detecting fail block using logic block address and data buffer address in storage tester
By Francis Pelletier | April 17, 2017 at 2:44 pmUnitest, Inc., Yongin-si, Gyeonggi-do, Korea, has been assigned a patent (9,613,718) developed by Han, Young Myoun, Gangwon-do, Korea, for a “detection system for detecting fail block using logic block address and data buffer address in a storage tester.“
The abstract of the patent published by the U.S. Patent and Trademark Office states: “Disclosed is a detection system for detecting fail block using logic block address and data buffer address in a storage tester, which is capable of comparing data read from SSD test without expected data buffer. The system comprises a device driver for controlling HBA, a request processor for reading the request to Root Complex and transmitting the result to a data engine, and the data engine for generating data to be transmitted to SSD and comparing the read data.“
The patent application was filed on August 7, 2014 (14/453,647).
Subscribe to our free daily newsletter
