NEC Assigned Patent

NEC Corporation, Tokyo, Japan, has been assigned a patent (9,274,869) developed by Yabuki, Kentarou, Tokyo, Japan, for a “apparatus, method and storage medium for fault cause extraction utilizing performance values.”

The abstract of the patent published by the U.S. Patent and Trademark Office states: ”A fault cause extraction apparatus including a storage unit which stores a model including one or more correlation functions between pieces of performance information acquired from a plurality of elements and a correlation-destruction-propagation detecting unit which calculates a degree of influence for each of the elements based on correlation destruction information. The correlation destruction information is calculated based on whether pieces of performance information newly acquired from the elements satisfy a relationship represented by the correlation functions.“

The patent application was filed on May 2, 2014 (14/268,413).