Synopsys On-Chip Memory Test and Repair Solution for Embedded Flash

Synopsys, Inc., in software, IP and services used to accelerate innovation in chips and electronic systems, introduced the DesignWare Star Memory System (DSMS) for embedded flash product, an integrated memory test and repair solution with test algorithms optimized for on-chip embedded flash memories.

It is an automated pre- and post-silicon memory test, diagnostic and repair solution that enables designers to improve test coverage, reduce design time, lower test costs and maximize manufacturing yield. The Star Memory System for embedded flash is a built-in self-test (BIST) solution that tests for the failure mechanisms associated with embedded flash memories, reducing overall integration time and cutting associated test costs by 20% compared to external solutions. Embedded flash memories are increasingly used with microcontrollers in SoCs for Internet of Things (IoT) wearables, smart appliances and automotive safety systems, which have stringent cost and reliability requirements.

“Synopsys’ DesignWare STAR Memory System for Embedded Flash is a valuable product for chip designers utilizing our highly popular 55-nanometer process, which has already been widely adopted for numerous IoT applications,” said Shih Chin Lin, senior director IP development and design support division, United Microelectronics Corporation. “This solution provides our mutual customers with integrated test and repair capabilities that reduce overall design effort and lower test costs. Designers who are taking advantage of our 55-nanometer eFlash process will find that the post-silicon debug and analysis capabilities of Synopsys’ Yield Accelerator and Silicon Browser will make designers’ product characterization and validation efforts even more efficient.“

The Star Memory System for Embedded Flash offers in-field diagnostic capabilities to identify issues during system operation. With these capabilities, memory issues can be diagnosed even after the devices have shipped to the end customer.

The Star Memory System allows hierarchical generation and verification of the test and repair IP to be inserted into the SoC while maintaining the original design hierarchy. This can reduce integration effort and SoC development time by allowing reuse of existing design constraints and configuration files. Additionally, the post-silicon Yield Accelerator and Silicon Browser features can reduce the time required for silicon bring-up and defect analysis for yield optimization, enabling the ramp to volume production to occur in weeks rather than months. Used in billions of chips, the STAR Memory System is a two-time winner of Test & Measurement World’s Best in Test award.

“SoC designers for IoT and automotive devices must implement cost-effective features that enable efficient test and diagnostics for the full life cycle of their products,” said John Koeter, VP marketing IP and prototyping, Synopsys. “Testing embedded flash memories has historically required expensive external test solutions. With STAR Memory System for Embedded Flash, designers can reduce their test cost and development schedules, getting their products to market faster.“

Highlights:

• Extends the Star Memory System to support embedded flash memories

• Provides test coverage and in-field diagnostics of the failure mechanisms associated with embedded flash memories

• Eliminates the need for expensive external test solutions for embedded flash memories

• Reduces overall design integration effort, development cycle and test cost

• Leverages Star Memory System Silicon Browser and Yield Accelerator for more efficient SoC bring-up and faster time-to-volume

The Star Memory System for Embedded Flash is available for UMC’s 55-nanometer process.