Fusion-io Assigned Two Patents
Data validity in storage process, read voltage threshold for SSD
By Jean Jacques Maleval | November 28, 2012 at 2:56 pmApparatus, system, and method
for ensuring data validity in data storage process
Fusion-io, Inc., Salt Lake City, UT, has been assigned a patent (8,316,277) developed by David Flynn, Sandy, UT, Jonathan Thatcher, Lehi, UT, and John Strasser, Syracuse, UT, for an "apparatus, system, and method for ensuring data validity in a data storage process."
The abstract of the patent published by the U.S. Patent and Trademark Office states: "An apparatus, system, and method are disclosed for ensuring data validity in a data storage process. A data receiver module receives a storage block and existing parity information. An ECC generation module generates error correcting code (ECC) check bits for the data of the storage block in response to receiving the storage block and the existing parity information. The ECC check bits for the storage block are generated using a block code, a convolutional code, etc. A pre-storage consistency module uses the data of the storage block, the existing parity information, and the ECC check bits to determine if the data of the storage block, the existing parity information, and the ECC check bits are consistent. A data storage module stores the data of the storage block and the ECC check bits the data storage device without storing the existing parity information."
The patent application was filed on April 5, 2008 (12/098,427).
Apparatus, system, and method for determining
read voltage threshold for solid-state storage media
Fusion-io, Salt Lake City, UT, has been assigned a patent (8,315,092) developed by four co-inventors for an "apparatus, system, and method for determining a read voltage threshold for solid-state storage media."
The co-inventors are John Strasser, Syracuse, UT, David Flynn, Sandy, UT, Jeremy Fillingim, Salt Lake City, UT and Robert Wood, Nwot, CO.
The abstract of the patent published by the U.S. Patent and Trademark Office states: "An apparatus, system, and method are disclosed for determining a read voltage threshold for solid-state storage media. A data set read module reads a data set from storage cells of solid-state storage media. The data set is originally stored in the storage cells with a known bias. A deviation module determines that a read bias for the data set deviates from the known bias. A direction module determines a direction of deviation for the data set. The direction of deviation is based on a difference between the read bias of the data set and the known bias. An adjustment module adjusts a read voltage threshold for the storage cells of the solid-state storage media based on the direction of deviation."
The patent application was filed on Jan. 27, 2011 (13/015,458).