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Two SSD Multi-Protocol Testers by Advantes

Testing up to 768 devices in parallel at chip, module and system level

Advantest Corporation showcased two multi-protocol systems for testing advanced storage devices at the chip, module and system level at the Flash Memory Summit in Santa Clara, CA.

MPT3000 system

ADVANTEST_MPT3000

The MPT3000HVM system is designed to achieve the lowest cost in high-volume testing of SSDs. It is a multi-protocol SSD test solution and can support multiple form factors as well, making it a versatile, modular and scalable SSD tester. Downloadable firmware enables the MPT3000HVM to test any major protocol including SAS 12G, SATA 6G and PCIe with NVMe or AHCI. In addition, Stylus software makes the system easy to use and gives it the capability to be used in both engineering and production environments.

T5851 Memory Test System

ADVANTEST_T5851 Memory Test System

The T5851 is capable of performing high-volume testing, as well as reliability and qualification testing, of protocol NAND devices. Based on the T5800 platform that has been adopted by several memory integrated device manufacturers (IDMs) and outsourced semiconductor assembly and test (OSAT) companies, the flexible T5851 system can be configured for high-volume production and test up to 768 devices in parallel by matching it with an automated component handler such as company’s M624x series handler. Like the MPT3000 platform, it provides multi-protocol support in one tool for high-performance universal flash storage (UFS) devices and PCIe BGA SSDs. T5851 units with x512 and x768 parallel-testing configurations are being shipped to customers.

Both the MPT3000HVM and the T5851 system-level test solutions use a tester-per-DUT architecture and proprietary hardware accelerator to deliver fast test times. Additionally, they leverage the same FPGA multi-protocol architecture, minimizing customers’ capital investments and deployment risks.

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